Identification of discharge coefficients of orifice-type by Viktorov, Vladimir; Belforte, Guido; Trivella, Andrea;

By Viktorov, Vladimir; Belforte, Guido; Trivella, Andrea; Raparelli, Terenziano

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A 291, pp. 520–536, (1966). L. Wong, F. Guo and C. Feng, The measurement of the refractive index of a liquid lubricant at high pressure within an EHL impact dimple using a single optical interferogram, Tribology International 36 (7), pp. 497-504, (2003). D. Heijden, Image Based Measurement system, John Wiley & Sons, pp. 76-77, (1994). [54] T. Bose, Digital signal and image processing, Wiley, pp. 606-609, (2004). R. Smith, Color gamut transform pairs, Computer Graphics 12(3), pp. 12-19, (1978). html.

1 Amorphous carbon characteristics The peculiar electronic configuration of carbon atoms, 1s2 2s2 2p2, and the small energy difference between their 2p and 2s orbitals, compared to the binding energy of the carbon bonds, allow the electrons to rearrange in s and p mixed orbitals that enhance the binding energy with other atoms. This process is called hybridization and produces three different types of orbitals: sp = s + p, sp2 = s + p + p and sp3 = s + p + p + p. Each different bonding state corresponds to a certain structural arrangement: sp bonding gives rise to chain structures (with two σ bonds and two π bonds), sp2 bonding conforms onto planar structures (three σ bonds and one π bond) and finally sp3 bonding produces tetrahedrical structures (four σ bonds).

Nonishi et al. [16, 17] used the optical interferometry technique to study the influence of sliding on the elastohydrodynamic film. The film thickness formed between a crowned roller and a sapphire disk was measured with optical interferometry. Yang et al. [18] studied the dimple phenomena in EHL point contact formed by a glass disk and a steel ball with optical interferometry. Félix-Quinonez et al. [19] combined the optical interferometry technique with a high-speed color video camera for automatic anlaysis of interferograms, which allowed rapid imaging for the variations of interference fringe orders and film thickness.

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